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Reliability of MEMS Testing of Materials and Devices PDF

326 Pages·2006·5.254 MB·English
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Author:Osamu Tabata, Toshiyuki Tsuchiya, Oliver Brand, Gary K. Fedder, Christofer Hierold, Jan G. Korvink
Publication Year:2006
Pages:326
Language:English
File Size:5.254
Format:PDF
Price:FREE
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