Table Of ContentMaterials Science / Materials Processing Nastasi
Mayer
Wang
"... a must-have ion beam analysis textbook or reference handbook … . It covers all
aspects of ion beam fundamentals and important applications with tables, charts, and Ion Beam
excellent examples."
—Wei-Kan Chu, Research Director and Distinguished University Professor of Physics,
The University of Houston
"... immensely useful as a reference or textbook ..."
—Floyd Del McDaniel, Professor of Physics and Materials Science & Engineering,
Director of the Ion Beam Modification and Analysis Laboratory, University of North Texas Analysis
"... brings together all the essential knowledge in a convenient, compact, and
I
up-to-date way."
o
—S.T. Picraux, Chief Scientist, Center for Integrated Nanotechnologies,
Los Alamos National Laboratory n
"An indispensable book for everyone, student or expert, dealing with ion beam analysis
... . Highly recommended." B
—Andrzej Turos, Professor and Head of the Department of Microstructural Research,
e
University of Warsaw
a Fundamentals and Applications
".. an important addition to the libraries of scientists and engineers who are already
practitioners of these important techniques, but its main utility will be for students, in a m
wide spectrum of fields, whose research could potentially benefit from IBA or those who
are just starting to utilize IBA."
—Barney L. Doyle, Distinguished Member of the Technical Staff, Sandia National A
Laboratories
n
Ion Beam Analysis: Fundamentals and Applications explains the basic character-
istics of ion beams as applied to the analysis of materials, as well as ion beam analysis a
(IBA) of art/archaeological objects. It focuses on the fundamentals and applications of
ion beam methods of materials characterization. l
y Michael Nastasi
(cid:127) Examines classical collision theory
s
(cid:127) Details the fundamentals of five specific ion beam analysis techniques
(cid:127) Illustrates specific applications, including biomedicine and thin film analysis i James W. Mayer
(cid:127) Provides examples of IBA in traditional and emerging research fields s
engagements conducted by the authors
Yongqiang Wang
Supplying readers with the means to understand the benefits and limitations of IBA,
the book offers practical information that users can immediately apply to their own
work. It covers the broad range of current and emerging applications in materials
science, physics, art, archaeology, and biology. It also includes a chapter on
computer simulation and data analysis in IBA.
K12077
Ion Beam
Analysis
Ion Beam
Analysis
Fundamentals and Applications
Michael Nastasi
James W. Mayer
Yongqiang Wang
Boca Raton London New York
CRC Press is an imprint of the
Taylor & Francis Group, an informa business
CRC Press
Taylor & Francis Group
6000 Broken Sound Parkway NW, Suite 300
Boca Raton, FL 33487-2742
© 2015 by Taylor & Francis Group, LLC
CRC Press is an imprint of Taylor & Francis Group, an Informa business
No claim to original U.S. Government works
Version Date: 20140514
International Standard Book Number-13: 978-1-4398-4639-1 (eBook - PDF)
This book contains information obtained from authentic and highly regarded sources. Reasonable efforts
have been made to publish reliable data and information, but the author and publisher cannot assume
responsibility for the validity of all materials or the consequences of their use. The authors and publishers
have attempted to trace the copyright holders of all material reproduced in this publication and apologize to
copyright holders if permission to publish in this form has not been obtained. If any copyright material has
not been acknowledged please write and let us know so we may rectify in any future reprint.
Except as permitted under U.S. Copyright Law, no part of this book may be reprinted, reproduced, transmit-
ted, or utilized in any form by any electronic, mechanical, or other means, now known or hereafter invented,
including photocopying, microfilming, and recording, or in any information storage or retrieval system,
without written permission from the publishers.
For permission to photocopy or use material electronically from this work, please access www.copyright.
com (http://www.copyright.com/) or contact the Copyright Clearance Center, Inc. (CCC), 222 Rosewood
Drive, Danvers, MA 01923, 978-750-8400. CCC is a not-for-profit organization that provides licenses and
registration for a variety of users. For organizations that have been granted a photocopy license by the CCC,
a separate system of payment has been arranged.
Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used
only for identification and explanation without intent to infringe.
Visit the Taylor & Francis Web site at
http://www.taylorandfrancis.com
and the CRC Press Web site at
http://www.crcpress.com
Dedicated to the memory of Jim Mayer—
innovator, educator, colleague, and friend
Brief Contents
Section i — Fundamentals
chapter 1 Overview ..................................................................................................................................3
chapter 2 Kinematics ...............................................................................................................................9
chapter 3 Cross Section ......................................................................................................................25
chapter 4 Ion Stopping .......................................................................................................................39
chapter 5 Backscattering Spectrometry ..................................................................................57
chapter 6 Elastic Recoil Detection Analysis ............................................................................79
chapter 7 Nuclear Reaction Analysis.........................................................................................113
chapter 8 Particle-Induced X-Ray Emission Analysis .......................................................141
chapter 9 Ion Channeling ................................................................................................................171
Section ii — Applications
chapter 10 Thin Film Depth Profiling ..........................................................................................197
Chris Jeynes and Richard L. Thompson
chapter 11 Defects Measurements of a Crystalline Solid ...............................................221
Lin Shao
vii
viii Brief Contents
chapter 12 Nuclear Energy Research Applications .............................................................241
Yongqiang Wang and Amit Misra
chapter 13 Art and Archaeology Applications ......................................................................267
Thomas Calligaro and Jean-Claude Dran
chapter 14 Biomedical Applications ...........................................................................................309
Harry J. Whitlow and Min-Qin Ren
chapter 15 IBA Software .....................................................................................................................339
Nuno P. Barradas, Matej Mayer, Miguel A. Reis, and François Schiettekatte
