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About Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy
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Detailed Information
| Author: | Brian S.R. Armstrong, José A. Gutierrez (auth.) |
|---|---|
| Publication Year: | 2008 |
| Pages: | 162 |
| Language: | English |
| File Size: | 5.906 |
| Format: | |
| Price: | FREE |
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