Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

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Author:Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson (eds.)
Language:English
Release year:2016
File size:52.031 MB
Number of page:588

Similar Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

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