Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

ebook img
Author:Adam Foster, Werner Hofer,
Language:English
Release year:2006
File size:7.576 MB
Number of page:291

Similar Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

We use cookies

We use cookies to ensure you get the best browsing experience on our website. By clicking "Accept Cookies", you agree that we can store cookies on your device in accordance with our Terms and Privacy.